ISO IEC 10373-3 pdf download – Identification cards — Test methods — Part 3: Integrated circuit cards with contacts and related interface devices

ISO IEC 10373-3 pdf download – Identification cards — Test methods — Part 3: Integrated circuit cards with contacts and related interface devices
Scope
This part of lSO/EC 10373 defines test methods for characteristics of integrated circuit cards with contactsand related interface devices according to the definition given in ISo/EC 7816. Each test method iscross-referenced to one or more base standards，which can be lSO/IEC 7810 or one or more of thesupplementary International Standards that define the information storage technologies employed inidentification card applications.
NOTE Criteria for acceptability do not form part of this part of ISOIEC 10373 but will be found in the InternationalStandards mentioned above.
This part of ISO/IEC 10373 defines test methods which are specific to integrated circuit technology withcontacts.ISO/IEC 10373-1 defines test methods which are common to one or more card technologies andother parts define other technology-specific tests.
Test methods defined in this part of lSOIEC 10373 are intended to be performed separately andindependently.A given card is not required to pass through all the tests sequientially. The test methodsdefined in this part of ISO/IEC10373 are based on ISO/IEC 7816-3.
Conformance of cards and IFDs determined using the test methods defined in this part of ISOIEC 10373does not preclude failures in the field.Reliability testing is outside the scope of this part of lSO/IEC 10373.
This part of ISO/IEC 10373 does not define any test to establish the complete functioning of integrated circuitcards.The test methods require only that the minimum functionality be verified. Minimum functionality isdefined as follows.
Any integrated circuit present in the card continues to show an Answer to Reset response whichconforms to the base standard.
Any contacts associated with any integrated circuit present in the card continue to show electricalresistance which conforms to the base standard.
2Normative references
The following referenced documents are indispensable for the application of this document. For datedreferences，only the edition cited applies. For undated references,the latest edition of the referenceddocument (including any amendments) applies.
ISO/IEC 7810:2003,ldentification cards – Physical characteristics
ISOIEC7816-3:2006，ldentification cards — Integrated circuit cards — Part 3: Cards with contacts一Electrical interface and transmission protocols
ISO/IEC 7816-4:2005，ldentification cards — Integrated circuit cards — Part 4:Organization, security andcommands for interchange
3Terms and definitions
For the purposes of this document, the following terms and definitions apply.
3.1
card
integrated circuit card with contacts as defined in lSO/EC 7816
3.2
DUT
device under test
card or lFD that is subject to testing
3.3
etu-factor
parameters negotiable by protocol and parameters selection (PPS), described in lSOIEC7816-3:2006,6.3.1
3.4
IFD
interface device related to integrated circuit cards with contacts as defined in ISOIEC7816-3
3.5
normal use
use as an identification card，as defined in ISO/IEC 7810:2003，4.1，involving equipment processesappropriate to the card technology and storage as a personal document between equipment processes
3.6
test method
method for testing characteristics of identification cards and related interface devices for the purpose ofconfirming their compliance with International Standards
3.7
test scenario
defined typical protocol and application specific communication to be used with the test methods defined inthis part of lsonIEC 10373
3.8
typical protocol and application specific communication
communication between a DUT and the corresponding test-apparatus based on protocol and applicationimplemented in the DUT and representing its normal use
4General items applicable to the test methods
4.1Test environment
Unless otherwise specified,testing of physical, electrical and logical characteristics shall take place in anenvironment of temperature 23 °ci3°C, of relative humidity 40 % to 60 %.